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Hitachi High-Tech Analytical Science EA6000VX 元素分析仪

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  • EA6000VX

  • 元素分析仪

  • Hitachi High-Tech Analytical Science

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  • Hitachi High-Tech Analytical Science

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特性

  • High resolution SDD
  • Element range : Mg - U (Na - U when using helium purge)
  • Chamber design : closed
  • XY stage options : motorized
  • Largest sample : 270 x 220 x 150 mm
  • Maximum number of collimators : 4
  • Filters : 6 mode automatic switching
  • Smallest collimator : 0.2mm
  • X-ray Station & Mapping Station software

"Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds.","Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analyzing solids or liquids over a wide element range from 13Al to 92U on the periodic table.","EA6000VX"

EA6000VX 元素分析仪技术参数

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特 性
分析测试介质/材料 Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material
分析元素 Metal / Metalloid; Element Range : Mg - U (Na - U when using helium purge)
更多规格
分析方法/检测技术 Vortex SDD X-Ray Detector
产品类别 Elemental Analyzers
样本类型 Solid Samples

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